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Features

1. Solid Direct Analysis
Eliminating the solution preparation step and performing direct analysis with ICP

2.High-speed analysis
High-speed analysis using a galvanometer mirror

3. Localized analysis
Pinpoint measurement of microscopic areas on the sample surface
- FHG f’s laser reduces thermal effects and generates finer and more precise particles.
- High-speed ablation by galvanometer scanner.
- High spatial resolution measurement is possible with a minimum 1μmφ light focus diameter.
- Equipped with a goniometer to compensate for sample tilt.
- Ablation shape can be set arbitrarily by using a tablet terminal.
General Specifications
- Laser :Quadruple wave femtosecond
- Optical instrument : Galvano scanner
- Focusing lens
- Raijin alpha : fθ
- Ryujin:fθ, objective lens
Inquiry for details
For detailed equipment specifications, features, or sample processing inquiries, please use the inquiry button located at the top right.