Model Number:SS-30WD

Bond Tester – Multifunctional High-Precision Tensile Strength Tester

  • Precision Equipment
  • Various development equipment
卓上型ボンドテスターの外観。ワイヤプル試験・シェア試験に対応

An all-in-one strength testing machine that performs seven types of strength measurements with a single load cell.

Die shear test, ball shear test, bump shear test, wire pull test, pull test, peel test (90° / 180°), and push test — an all-in-one universal system that does it all.

ボンドテスターの画像

Overview

・Bond tester (strength testing machine) designed for evaluation in semiconductor and electronic component applications

・Supports a wide range of tests, including shear tests, wire pull tests, and chip delamination strength tests

・Flexible use from R&D applications to inspection and production processes

・Enables evaluations based on test concepts referenced in JIS and MIL standards

・Focuses on essential performance to achieve both high measurement accuracy and cost efficiency

Compact, benchtop design suitable for inspection processes where over-spec systems are impractical

Custom fixture design available for complex workpiece shapes and restrictive test conditions

・Supported by in-house mechanical design engineers for tailored testing solutions

・Japanese-manufactured system offering proven reliability

Significantly lower introduction cost compared to equipment with equivalent functionality

Supported Tests

(When performing shear tests) Die shear test, ball shear test, bump shear test
(When performing pull or push tests) Wire pull test, pull test, peel test (90°/180°), push test

Wire pull test (destructive) (MIL standard: MIL-STD-883 Method 2011.7)
→ Gold and aluminum wires

Wire pull test (non-destructive) (MIL standard: MIL-STD-883 Method 2023.5)
→ Gold and aluminum wires

Package lead reliability test (MIL standard: MIL-STD-883 Method 2004)
→ IC packages

Lid torque test (MIL standard: MIL-STD-883 Method 2024)
→ Package sealing area

Stud pull test (MIL standard: MIL-STD-883 Method 2019)
→ Stud bonding joints

Bond shear test (JEDEC standard: JEDEC JESD22-B116A)
→ Wire bond shear

Solder ball pull test (JEDEC standard: JEDEC JESD22-B117)
→ BGA / CSP

Tensile and bend test of solder joints (IEC-compliant: JIS C 60068-2-21)

Note: The above tests are evaluations conducted with reference to the test methods and concepts described in the relevant standards. This does not indicate that the equipment itself is certified or approved under these standards.

Measurement range

Supports loads from a minimum of 2 gf up to a maximum of 50 kgf.
By selecting from four different load cells, the system covers a wide range from ultra-low forces to high loads.
Each load cell offers two measurement ranges, allowing optimal configuration based on the test method and material characteristics.

Load Cell Types Measurement range IMeasurement range II
3kgf20gf 〜 3000gf2gf 〜 300gf
15kgf0.1kgf 〜 15kgf10gf 〜 1.5kgf
25kgf0.2kgf 〜 25kgf20gf 〜 2.5kgf
50kgf0.4gf 〜 50kgf40gf 〜 5kgf

Features

■ Reliable measurement accuracy with excellent repeatability

Equipped with a high-precision load cell

Measurement accuracy: ±0.1%, with load cell precision of 0.015%.
Captures even the slightest changes with high precision.

Auto-zero correction & dead zone load setting

Eliminates unwanted noise for consistent and repeatable data acquisition.

Minimizes fluctuation with ultra-low-speed control

Control range from 0.006 mm/sec to 1 mm/sec.
The micro-step motor drastically reduces drive vibration during measurement.

High precision even in deviation measurements

Even at a 150 mm offset and half of the rated capacity, the error is just 0.02%.
Accurate load values are maintained even when measurements are taken off-center.

■ Data processing software that visualizes measurement results

Load data table

Displays measurement data such as maximum load, distance, and mode in a clear table format.
Saved data can be exported to Excel, making analysis and report creation smooth and efficient.

ボンドテスターの荷重データ表。ワイヤプル試験・シェア試験時の測定範囲と分解能を示した一覧

Load variation graph

Visualizes the relationship between load and displacement,
allowing you to instantly see how the load changes up to the point of sample breakage.

ボンドテスターによる荷重―変位グラフ。ワイヤプル試験時の荷重変化と変位量の関係を示す

■ Comes standard with a JQA calibration certificate.

This product comes with a calibration certificate issued by JQA (Japan Quality Assurance Organization).
The calibration is accredited under ISO/IEC 17025, and the certificate features the JCSS and U.S. A2LA symbols, meeting both domestic and international quality control standards.


It provides reliability and peace of mind for use in research institutions and manufacturing sites where traceability is essential.

Specifications

Measurement Range 2gf ~ 50kgf
Load Measurement Accuracy
±0.1% FS
Measurement Stroke X-axis: 100 mm
Z-axis: 100 mm
Stroke Setting Unit X-axis : 1 µm
Z-axis : 1 µm
Measurement Speed 0.006mm/sec ~ 1mm/se
Axis Adjustment Range X/Z travel: 100 mm each (0.025 µm/pulse, driven by micro-step motor)
Work Stage Dimensions 100mm × 100mm
Stage X-Axis Adjustment Range 100mm
Stage Y-Axis Adjustment Range 64mm
Stage θ-Axis Adjustment Range ±10°
Data Output RS-232C
Data Input Measurement date, lot number, sample number, measured value, and measurement distance data
Calculation Functions Functions for calculating maximum, minimum, average, standard deviation, and fracture mode-specific analysis
Other Features Auto-zero correction, safety stop function, auto step-back function,
dead zone load setting, and auto return function
Options Data processing software, heating stage, CCD camera & monitor,
capture board, measurement software, and custom support for various test jigs and stages
Power Supply AC 100V, 1A / Weight: 80 kg

Application Examples by Industry

DepartmentCAR&DProduct development department
Final product Semiconductors LEDs Power devicesMetal paste Resin products Home appliancesSemiconductors LEDs Power devices
Test content / objectiveStrength testing of substrate wire frames Strength testing of bonded joints of components mounted on substrates Bond strength testing of chips mounted on wafersPush test (destructive test) Repeated strength test * Strength testing of substrate wire frames * Bond strength testing of components mounted on substrates * Bond strength testing of chips mounted on wafers

Case studies

Case01: CA team

Although a bond tester was already in use for R&D purposes, it had reached its limits in both performance and operation when applied to mass production processes.
In addition, the existing equipment was aging, and rising prices for replacement systems from manufacturers had become a major concern.
As a result, the customer decided to continue using the existing system for R&D while considering an investment in a practical, cost-effective solution dedicated to production use.

• Ability to use equipment from multiple manufacturers depending on the application

• Preference for a system optimized for mass production, with a well-balanced combination of essential performance and reasonable cost

Based on these requirements, our product was selected.

Case02: R&D team

Although the customer already owned a bond tester for R&D use, it had limitations in both specifications and operational efficiency when applied to mass production processes.
In addition, the existing equipment was aging, and rising costs associated with manufacturer upgrades had become a challenge.
Therefore, the customer decided to continue using the existing system for R&D while exploring an investment in a practical, cost-effective solution dedicated to production use.

• Desire to use equipment from multiple manufacturers depending on the application

• Emphasis on a balance between essential performance and cost, suitable for mass production processes

Based on these requirements, our product was selected.

Case03: Product Development Department

In addition to the strength testing equipment already in use, the customer was looking for a new strength testing machine suitable for a different application.

• Ability to accommodate specially shaped workpieces
• Capability to support non-standard inspection methods
• Relatively low cost

Based on these criteria, our product was selected.

Comparison with other manufacturers

manufacturerLoad measurement range Measurement accuracy Other specifications
SEISHIN【SS-30WD】Pull / Push: 3–50 kg Shear test: 3–50 kg±0.1%Measurement speed range: 0.006 mm/s to 1 mm/s Travel range: X-axis 100 mm, Y-axis 64 mm
Company APull / Push: 100 kg Shear test: 200 kg ±0.1%Measurement speed range: 0.7–50 mm/s Travel range: X, Y axes ±80 mm, Z axis 75 mm
Company BPull / Push: 100 kg Shear test: 200 kg ±0.075%Measurement speed range: up to 50 mm/s X-axis: 370 mm Y-axis: 168 mm Z-axis: 168 mm
Company CPull / Push: 100 kg Shear test: 200 kg ±0.2%Measurement speed range: 0.001–5 mm/s Travel range: X, Y axes ±50 mm, Z axis 70 mm

inquiry

Can this workpiece shape be tested?

Is it possible to reduce costs while maintaining equivalent functionality?

Can you consult us about test methods not listed in the catalog?

To what extent can custom fixture design be supported?

What would the price be for the specifications you require?

If you have any questions or would like to discuss your requirements, please feel free to contact us via the inquiry button at the top right.