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PL System for Si-impurity Measurement

PL-82IGA IR-Spectrograph

Style Photoluminescence system

PL-82IGA
[Features]

The Photoluminescence systems have been used to measure the trace concentration of the impurities ( B , P , etc.) in the Si Crystal.
PL-82IGA is the High-throughput and High-sensitive last-model of our PL-System. This system has the High-Sensitivity InGaAs Array Detector with 1-meter Spectrograph. And this system covers the total measuring time in almost 1/10, to be compared with the previous model (PMT Detector type).

Data of Si-PL spectrum

Data of Si-PL spectrum02
Data of Si-PL spectrum02

Specification in silicon single crystal

Pixel Resolution: 0.02 nm/pix.
Concentrations ranging (B,P) : 1×10 11 − 1×1014 atms/cc
Sample Size : 20 × 7 mm ( 21 samples 1 run at 4.2K )
(Also the information of the concentrate of As, Al could be obtained.)

If you are interested in our PL system, please contact to us.

    m_yatagai@seishin-syoji.co.jp

Manufacturer : SEISHIN TRADING CO., LTD.
2-1, 1-CHOME, SANNOMIYA-CHO, CHUO-KU, KOBE, 650-0021 JAPAN
http://www.seishin-syoji.co.jp/
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